The FE-SEM produces ultra-high resolution images of conductive samples. The microscope is mainly used for topographical evaluation and chemical manual and automated inclusion analysis in Fe-alloys. The JEOL 7200F has an in-lens shottky field emitting cathode (1-30kV) and is assemled with various state of the art detectors. Due to the high optical/chemical resolution and [...]
The SEM produces high resolution images of conductive and non conductive samples. The microscope is mainly used for manual topographical and chemical analysis of Fe-alloys, ores, dusts and slags. The Quanta 200 Mk2 has a high performance thermal emission SEM column (W) and is assembled with various detectors. A special feature of this microscope [...]
The Polivar Reichert-Jung MEF 2 is an industrial microscope. It is equipped with six objectives (magnifications x2.5, x5, x10, x20, x50 and x100) and a diamond marker. Bright/dark field and interfered contrast observations can be executed. For morphological grey scale based evaluations a 4MPix camera and Clemex Vision PE Software version 7.0 is used. [...]
The Nikon MM 40 Measuring Microscope System is equipped with a motorized stage and focus. Samples can be observed with six objectives (magnifications x1.5, x5, x10, x20, x50 and x100) with an ocular lens of x10. For morphological grey scale based evaluations a 1.3MPix camera and Clemex Vision PE Software version 7.0 is used. [...]
The metallographic preparation laboratory of the institute is equipped with typical used machines needed for metallographic sample preparation. The laboratory contains a precision wet abrasive cut-off machine, a semi automated and an automated embedding machines. For micrograph preparation at least five different grinding and polishing devices can be used. Grinding operations of 1200, 600, [...]
