FE-SEM JEOL 7200F

FE-SEM JEOL 7200F

The FE-SEM produces ultra-high resolution images of conductive samples. The microscope is mainly used for topographical evaluation and chemical manual and automated inclusion analysis in Fe-alloys. The JEOL 7200F has an in-lens shottky field emitting cathode (1-30kV) and is assemled with various state of the art detectors. Due to the high optical/chemical resolution and rapid data reprocessing fast and reliable measurements can be performed.

Advantages of FE-SEM JEOL 7200F:

  • detectors: UED, LED, BED, EDS (80mm²), EBSD
  • sample lock with plasma cleaner
  • ultra high resolution
  • automated longtime measurements over night
  • feature analysis tool, concentration mappings

Contact:

Bernd Lederhaas

Ing.
Metallographic Department
Details
2019-07-09T12:49:10+02:00
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