Secondary electron microscopy

The FE-SEM produces ultra-high resolution images of conductive samples. The microscope is mainly used for topographical evaluation and chemical manual and automated inclusion analysis in Fe-alloys. The JEOL 7200F has an in-lens shottky field emitting cathode (1-30kV) and is assemled with various state of the art detectors. Due to the high optical/chemical resolution and [...]

The SEM produces high resolution images of conductive and non conductive samples. The microscope is mainly used for manual topographical and chemical analysis of Fe-alloys, ores, dusts and slags. The Quanta 200 Mk2 has a high performance thermal emission SEM column (W) and is assembled with various detectors. A special feature of this microscope [...]