The FE-SEM produces ultra-high resolution images of conductive samples. The microscope is mainly used for topographical evaluation and chemical manual and automated inclusion analysis in Fe-alloys. The JEOL 7200F has an in-lens shottky field emitting cathode (1-30kV) and is assemled with various state of the art detectors. Due to the high optical/chemical resolution and rapid data reprocessing fast and reliable measurements can be performed.

Advantages of FE-SEM JEOL 7200F:

• detectors: UED, LED, BED, EDS (80mm²), EBSD
• sample lock with plasma cleaner
• ultra high resolution
• automated longtime measurements over night
• feature analysis tool, concentration mappings